The Q-Sense Ellipsometry Module is a module that fits in the Q-Sense E1 system, and enables simultaneous QCM-D and ellipsometric measurements on the same substrate. Both QCM-D and ellipsometric measurements are conducted in situ in the flow and temperature controlled chamber.
As the complexity of the studied systems increases, one technique alone can sometimes not provide all desired insight. Multitechnique approaches provide complementary information, and can in those cases give a more complete analysis. Therefore, merging several techniques into the same setup and monitoring events on the same surface is a promising approach.
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Q-Sense Ellipsometry Module 
